Contact Probes
_Contact Probes
_Filmetrics contact probes are suited for measuring thin films on curved and rough surfaces. The contact probes measure the thickness, refractive index and other parameters of thin films including flat or spherical samples, cylindrical and spherical samples as well as tighter concave surfaces. The unique design of each contact probe gives it superior performance and ease-of-use on flat, convex, and concave surfaces with no need for re-baselining or backside preparation.
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CP-1-1.3 Contact Probe
Contact probe for measuring on flat or spherical samples. Ruggedized stainless steel monocoil.
$1,717.88
CP-1-AR-1.3 Contact Probe
Similar to the CP-1-1.3, except optimized to reject backside reflections (96% rejection for substrate 1.5mm thick.) PVC-coated steel monocoil. For thicknesses up to 15?m.
$1,905.89
CP-2-1.3 Contact Probe
Contact probe for getting into tighter concave surfaces. 17.5mm diameter.
$1,872.83
CP-C6-1.3 Contact Probe
Contact probe for outside of cylindrical and spherical samples down to 6mm diameter
CP-C12-1.3 Contact Probe
Contact probe for outside of cylindrical and spherical samples down to 12mm diameter
CP-C26-1.3 Contact Probe
Contact probe for outside of cylindrical and spherical samples down to 26mm diameter